Quantitative X-Ray Microanalysis in the Analytical Electron Microscope

X-ray microanalysis attachment for electron microscope.

Quantitative X-ray microanalysis of thin specimens in the transmission electron microscope; a review

In a thin specimen X-ray absorption and fluorescence can, to a first approximation, be ignored and the observed X-ray intensity ratios, Ia/Ie, can be converted into weight fraction ratios, CA/CB, by multiplying by a constant kaB; CA/C B = kAB I A/IB. kAB values can be calculated or determined experimentally. The major correction which may have to be made to the calculated weight fraction ratio ...

X-ray Microanalysis of Cultured Cells in the Scanning Electron Microscope and in the Scanning Transmission Electron Microscope: a Comparison

X-ray microanalysis of cultured cells as “whole mounts” (i.e., not sectioned) is used frequently e.g., to study mechanisms of ion transport. Cells can be cultured either on solid substrates or on thin plastic films on grids. Cells cultured on solid substrates are analyzed in the scanning electron microscope at relatively low accelerating voltage, cells cultured on thin films can be analyzed in ...

X-Ray Microanalysis in the Variable Pressure (Environmental) Scanning Electron Microscope

Electron-excited x-ray microanalysis performed in the variable pressure and environmental scanning electron microscopes is subject to additional artifacts beyond those encountered in the conventional scanning electron microscope. Gas scattering leads to direct contributions to the spectrum from the environmental gas, as well as remote generation of x rays by electrons scattered out of the focus...

Fundamental Constants for Quantitative X-ray Microanalysis.

Quantitative X-ray microanalysis requires the use of many fundamental constants related to the interaction of the electron beam with the sample. The current state of our knowledge of such constants in the particular areas of electron stopping power, X-ray ionization cross-sections, X-ray fluorescence yield, and the electron backscattering yield, is examined. It is found that, in every case, the...